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9789356962026

Reliability Wearout Mechanisms in Advanced CMOS Technologies | Hardcover
by Strong
Highlights
9780471731726
ISBN:
Strong
Author:
624
Pages:
215 gm
Weight:
English
Language:
2009
Year:
1st Edition
Edition:
Hardcover
Binding:
₹14514
₹18143
This invaluable resource tells the complete story of failure mechanismsfrom basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.
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