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Fundamentals of Electromigration-Aware Integrated Circuit Design | Hardcover
by Lienig
Highlights
9783319735573
ISBN:
Lienig
Author:
159
Pages:
3910 gm
Weight:
English
Language:
2018
Year:
1st Edition
Edition:
Hardcover
Binding:
₹9700
₹12125
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigrations negative impact on circuit reliability.
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