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Image of - Eyelid | Conjuctival | and Orbital Tumors | Third Edition | Hardcover
Eyelid | Conjuctival | and Orbital Tumors | Third Edition | Hardcover

Eyelid | Conjuctival | and Orbital Tumors | Third Edition | Hardcover

by Shields

This volume expands and updates the coverage in the authors' popular 1992 book, Electron Micro diffraction. As the title implies, the focus of the book has changed from electron micro diffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry department

Highlights

  • binding-icon

    9781496321480

    ISBN:

  • binding-icon

    Shields

    Author:

  • binding-icon

    824

    Pages:

  • binding-icon

    239 gm

    Weight:

  • langauage-icon

    English

    Language:

  • date-icon

    2016

    Year:

  • edition-icon

    Third Edition

    Edition:

  • binding-icon

    Hardcover

    Binding:

₹27734

₹34667

This volume expands and updates the coverage in the authors' popular 1992 book, Electron Micro diffraction. As the title implies, the focus of the book has changed from electron micro diffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry department

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