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Image of - Atomic Force Microscopy | 2nd Edition | Hardcover
Atomic Force Microscopy | 2nd Edition | Hardcover

Atomic Force Microscopy | 2nd Edition | Hardcover

by Voigtlander B.

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to Scanning Probe Microscopy (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

Highlights

  • binding-icon

    9783030136536

    ISBN:

  • binding-icon

    Voigtlander B.

    Author:

  • binding-icon

    331

    Pages:

  • binding-icon

    215 gm

    Weight:

  • langauage-icon

    English

    Language:

  • date-icon

    2019

    Year:

  • edition-icon

    2nd Edition

    Edition:

  • binding-icon

    Hardcover

    Binding:

₹12934

₹16167

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to Scanning Probe Microscopy (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

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